Data quality metrics extracted from 2viu.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 2VIU at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Source type
_diffrn_source.source
SYNCHROTRON
Source details
_diffrn_source.type
LURE BEAMLINE DW32
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
LURE
Beamline
_diffrn_source.pdbx_synchrotron_beamline
DW32
Detector technology
_diffrn_detector.detector
IMAGE PLATE
Collection date
_diffrn_detector.pdbx_collection_date
1997-04-08
Detector
_diffrn_detector.type
MARRESEARCH
Software
Data collection
_software.classification
HKL
Data reduction
_software.classification
HKL
Phasing
_software.classification
X-PLOR (3.84)
Model building
_software.classification
X-PLOR (3.84)
Refinement
_software.classification
X-PLOR (3.84)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 21 3
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
144.4 144.4 144.4 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
0.97000 Å

Data quality metricsOverall
Low resolution limit [Å]
_reflns.d_resolution_low
20.000
High resolution limit [Å]
_reflns.d_resolution_high
2.450
Rmerge
_reflns.pdbx_Rmerge_I_obs
0.055
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique
_reflns.number_obs
36234
  <I/σ(I)> -
Completeness [%]
_reflns.percent_possible_obs
99.9
Multiplicity
_reflns.pdbx_redundancy
4.5
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
2VIU
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1997-12-22
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
9.0 - 2.500 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.2100 / 0.2420