Experiment | |
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Method _exptl.method | ELECTRON CRYSTALLOGRAPHY The method used in the experiment. |
Source type _diffrn_source.source | ELECTRON MICROSCOPE The general class of the radiation source. |
Source details _diffrn_source.type | Technai F30 The make, model or name of the source of radiation. |
Temperature [K] _diffrn.ambient_temp | 100 The mean temperature in kelvins at which the intensities were |
Detector technology _diffrn_detector.detector | CMOS The general class of the radiation detector. |
Collection date _diffrn_detector.pdbx_collection_date | 2019-04-04 The date of data collection. |
Detector _diffrn_detector.type | TemCam-XF416 The make, model or name of the detector device used. |
Wavelength(s) [Å] _diffrn_source.pdbx_wavelength_list | 0.0197 Comma separated list of wavelengths or wavelength range. |
Software | |
Data scaling _software.classification | XSCALE (Wolfgang Kabsch) The classification of the program according to its |
Refinement _software.classification | PHENIX (Paul D. Adams; PDAdams@lbl.gov) The classification of the program according to its |
General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 Hermann-Mauguin space-group symbol. Note that the |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 4.73 Unit-cell length a corresponding to the structure reported in 11.36 Unit-cell length b corresponding to the structure reported in 39.59 Unit-cell length c corresponding to the structure reported in 90.0 Unit-cell angle alpha of the reported structure in degrees. 90.0 Unit-cell angle beta of the reported structure in degrees. 90.0 Unit-cell angle gamma of the reported structure in degrees. |
Wavelength _diffrn_radiation_wavelength.wavelength | 0.01970 ÅThe radiation wavelength in angstroms. |
Data quality metrics | Overall | InnerShell | OuterShell |
---|---|---|---|
Low resolution limit [Å] _reflns.d_resolution_low _reflns_shell.d_res_low | 7.462 The largest value in angstroms for the interplanar spacings | 7.462 The highest value in angstroms for the interplanar spacings | 1.100 The highest value in angstroms for the interplanar spacings |
High resolution limit [Å] _reflns.d_resolution_high _reflns_shell.d_res_high | 1.000 The smallest value in angstroms for the interplanar spacings | 8.000 The smallest value in angstroms for the interplanar spacings | 1.000 The smallest value in angstroms for the interplanar spacings |
Rmerge _reflns.pdbx_Rmerge_I_obs _reflns_shell.Rmerge_I_obs | 0.253 The R value for merging intensities satisfying the observed | - | 0.691 The value of Rmerge(I) for reflections classified as 'observed' |
Rmeas _reflns.pdbx_Rrim_I_all _reflns_shell.pdbx_Rrim_I_all | 0.270 The redundancy-independent merging R factor value Rrim, | - | 0.733 The redundancy-independent merging R factor value Rrim, |
Rpim | - | - | - |
Total number of observations _reflns.pdbx_number_measured_all _reflns_shell.number_measured_obs | 12269 Total number of measured reflections. | - | 3027 The number of reflections classified as 'observed' |
Total number unique _reflns.number_obs _reflns_shell.number_unique_obs | 1339 The number of reflections in the REFLN list (not the DIFFRN_REFLN | - | 312 The total number of measured reflections classified as 'observed' |
<I/σ(I)> _reflns.pdbx_netI_over_sigmaI _reflns_shell.meanI_over_sigI_obs | 4.12 The mean of the ratio of the intensities to their | - | 2.13 The ratio of the mean of the intensities of the reflections |
Completeness [%] _reflns.percent_possible_obs _reflns_shell.percent_possible_all | 97.4 The percentage of geometrically possible reflections represented | - | 98.1 The percentage of geometrically possible reflections represented |
Multiplicity _reflns.pdbx_redundancy _reflns_shell.pdbx_redundancy | 9.2 Overall redundancy for this data set. | - | 9.7 Redundancy for the current shell. |
CC(1/2) _reflns.pdbx_CC_half _reflns_shell.pdbx_CC_half | 0.970 The Pearson's correlation coefficient expressed as a decimal value | - | 0.807 The Pearson's correlation coefficient expressed as a decimal value |
Refinement | |
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PDB entry ID _entry.id | 6UOU |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 2019-10-15 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 1.0 - 1.040 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2495 / 0.2497 |