| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | NSLS BEAMLINE X12C |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | NSLS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | X12C |
Temperature [K] _diffrn.ambient_temp | 110 |
Detector technology _diffrn_detector.detector | CCD |
Collection date _diffrn_detector.pdbx_collection_date | 1995-12 |
| Software | |
Data reduction _software.classification | HKL (DENZO) |
Data scaling _software.classification | HKL (SCALEPACK) |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 1 2 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 193.32 102.46 157.08 90.0 97.8 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | NA |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1TYF |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1997-10-13 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 80.0 - 2.300 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2190 / 0.2920 |