| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | ROTATING ANODE |
Source details _diffrn_source.type | RIGAKU RU200 |
Temperature [K] _diffrn.ambient_temp | 295 |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1989-06-29 |
Detector _diffrn_detector.type | SIEMENS |
Wavelength(s) [Å] _diffrn_source.pdbx_wavelength_list | 1.5418 |
| Software | |
Data reduction _software.classification | XENGEN |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 61 2 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 78.3 78.3 243.2 90.0 90.0 120.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1TSZ |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-12-05 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 7.0 - 2.750 Å |
R _refine.ls_R_factor_obs | 0.1930 |
Rwork _refine.ls_R_factor_R_work | 0.1930 WARNING: no Rfree given? |