| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | NSLS BEAMLINE X4A |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | NSLS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | X4A |
Temperature [K] _diffrn.ambient_temp | 95 |
Detector technology _diffrn_detector.detector | IMAGE PLATE |
Collection date _diffrn_detector.pdbx_collection_date | 1997-05-05 |
Detector _diffrn_detector.type | FUJI |
| Software | |
Data reduction _software.classification | DENZO |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 1 21 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 48.23 56.52 90.90 90.00 94.48 90.00 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.02000 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1TIP |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1997-05-28 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 20.0 - 2.200 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2040 / 0.2860 |