| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | DIFFRACTOMETER |
Collection date _diffrn_detector.pdbx_collection_date | 1993-04-09 |
Detector _diffrn_detector.type | ENRAF-NONIUS FAST |
| Software | |
Data collection #1 _software.classification | MADNES |
Data collection #2 _software.classification | PROCOR |
Data reduction #1 _software.classification | MADNES |
Data reduction #2 _software.classification | PROCOR |
Data scaling _software.classification | XSCALE |
Phasing _software.classification | X-PLOR (3.1) |
Model building _software.classification | X-PLOR (3.1) |
Refinement _software.classification | X-PLOR (3.1) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 106.7 74.5 68.9 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54000 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1SMN |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-01-25 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 6.0 - 2.040 Å |
R _refine.ls_R_factor_obs | 0.1680 |
Rwork _refine.ls_R_factor_R_work | 0.1680 WARNING: no Rfree given? |