| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Experimental protocol _diffrn_radiation.pdbx_diffrn_protocol | SINGLE WAVELENGTH |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | SRS BEAMLINE PX7.2 |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | SRS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | PX7.2 |
Temperature [K] _diffrn.ambient_temp | 293 |
Detector technology _diffrn_detector.detector | FILM |
Collection date _diffrn_detector.pdbx_collection_date | 1993-10-21 |
| Software | |
Data reduction _software.classification | MOSCO |
Data scaling _software.classification | CCP4 |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR (3.851) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 43 21 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 128.5 128.5 116.3 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.48800 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 16.880 |
High resolution limit [Å] _reflns.d_resolution_high | 2.460 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.074 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 30529 |
| <I/σ(I)> | - |
Completeness [%] _reflns.percent_possible_obs | 84.9 |
Multiplicity _reflns.pdbx_redundancy | 3.0 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 2SKE |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1998-12-11 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 16.9 - 2.460 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1680 / 0.2180 |
Structure solution method _refine.pdbx_method_to_determine_struct | MOLECULAR REPLACEMENT |
Starting model (for MR) _refine.pdbx_starting_model | PDB ENTRY 2PRJ |