| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1992-03 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data collection _software.classification | XENGEN |
Data reduction _software.classification | XENGEN |
Data scaling _software.classification | XENGEN |
Phasing _software.classification | X-PLOR (3.0) |
Model building _software.classification | X-PLOR (3.0) |
Refinement _software.classification | X-PLOR (3.0) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 61 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 83.57 83.57 32.72 90.0 90.0 120.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 29.810 |
High resolution limit [Å] _reflns.d_resolution_high | 2.010 |
Rmerge _reflns.pdbx_Rsym_value | 0.042 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 7841 |
| <I/σ(I)> | - |
Completeness [%] _reflns.percent_possible_obs | 86.8 |
Multiplicity _reflns.pdbx_redundancy | 4.0 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1PSJ |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-05-24 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 6.0 - 2.000 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1570 / 0.2280 |
Structure solution method _refine.pdbx_method_to_determine_struct | MR |