Data quality metrics extracted from 1om1.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary.


Experimental information for 1OM1 at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
  The method used in the experiment.
Experimental protocol
_diffrn_radiation.pdbx_diffrn_protocol
SINGLE WAVELENGTH
  SINGLE WAVELENGTH, LAUE, or MAD.
Source type
_diffrn_source.source
SYNCHROTRON
  The general class of the radiation source.
Source details
_diffrn_source.type
ELETTRA BEAMLINE 5.2R
  The make, model or name of the source of radiation.
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
ELETTRA
  Synchrotron site.
Beamline
_diffrn_source.pdbx_synchrotron_beamline
5.2R
  Synchrotron beamline.
Temperature [K]
_diffrn.ambient_temp
100
  The mean temperature in kelvins at which the intensities were
  measured.
Detector technology
_diffrn_detector.detector
CCD
  The general class of the radiation detector.
Collection date
_diffrn_detector.pdbx_collection_date
2002-10-07
  The date of data collection.
Detector
_diffrn_detector.type
MARRESEARCH
  The make, model or name of the detector device used.
Wavelength(s) [Å]
_diffrn_source.pdbx_wavelength_list
1.2
  Comma separated list of wavelengths or wavelength range.
Software
Data collection
_software.classification
MAR345
  The classification of the program according to its
  major function.
Data scaling
_software.classification
CCP4 (SCALA)
  The classification of the program according to its
  major function.
Phasing
_software.classification
CNS
  The classification of the program according to its
  major function.
Refinement
_software.classification
CNS (1.0)
  The classification of the program according to its
  major function.
General information
Spacegroup name
_symmetry.space_group_name_H-M
C 1 2 1
  Hermann-Mauguin space-group symbol. Note that the
  Hermann-Mauguin symbol does not necessarily contain complete
  information about the symmetry and the space-group origin. If
  used, always supply the FULL symbol from International Tables
  for Crystallography Vol. A (2002) and indicate the origin and
  the setting if it is not implicit. If there is any doubt that
  the equivalent positions can be uniquely deduced from this
  symbol, specify the _symmetry_equiv.pos_as_xyz or
  _symmetry.space_group_name_Hall data items as well. Leave
  spaces between symbols referring to
  different axes.
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
141.524
  Unit-cell length a corresponding to the structure reported in
  angstroms.
60.276
  Unit-cell length b corresponding to the structure reported in
  angstroms.
44.546
  Unit-cell length c corresponding to the structure reported in
  angstroms.
90.00
  Unit-cell angle alpha of the reported structure in degrees.
102.63
  Unit-cell angle beta of the reported structure in degrees.
90.00
  Unit-cell angle gamma of the reported structure in degrees.
Wavelength
_diffrn_radiation_wavelength.wavelength
1.20000
  The radiation wavelength in angstroms.
 Å

Data quality metricsOverallOuterShell
Low resolution limit [Å]
_reflns.d_resolution_low _reflns_shell.d_res_low
34.500
  The largest value in angstroms for the interplanar spacings
  for the reflection data. This is called the lowest resolution.
1.770
  The highest value in angstroms for the interplanar spacings
  for the reflections in this shell. This is called the lowest
  resolution.
High resolution limit [Å]
_reflns.d_resolution_high _reflns_shell.d_res_high
1.680
  The smallest value in angstroms for the interplanar spacings
  for the reflection data. This is called the highest resolution.
1.680
  The smallest value in angstroms for the interplanar spacings
  for the reflections in this shell. This is called the highest
  resolution.
  Rmerge - -
  Rmeas - -
  Rpim - -
  Total number of observations - -
Total number unique
_reflns.number_obs
40418
  The number of reflections in the REFLN list (not the DIFFRN_REFLN
  list) classified as observed (see _reflns.observed_criterion).
  This number may contain Friedel-equivalent reflections according
  to the nature of the structure and the procedures used.
-
  <I/σ(I)> - -
Completeness [%]
_reflns.percent_possible_obs _reflns_shell.percent_possible_all
96.7
  The percentage of geometrically possible reflections represented
  by reflections that satisfy the resolution limits established
  by _reflns.d_resolution_high and _reflns.d_resolution_low and
  the observation limit established by
  _reflns.observed_criterion.
85.6
  The percentage of geometrically possible reflections represented
  by all reflections measured for this shell.
  Multiplicity - -
  CC(1/2) - -

Refinement
PDB entry ID
_entry.id
1OM1
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
2003-02-24