| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Collection date _diffrn_detector.pdbx_collection_date | 1993-06-18 |
Detector _diffrn_detector.type | SIEMENS |
Wavelength(s) [Å] _diffrn_source.pdbx_wavelength_list | 1.5418 |
| Software | |
Data collection _software.classification | XENGEN |
Data reduction _software.classification | XENGEN |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 1 2 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 163.240 45.970 53.715 90.00 97.16 90.00 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1MNP |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-01-27 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 8.0 - 2.000 Å |
R _refine.ls_R_factor_obs | 0.2000 |
Rwork _refine.ls_R_factor_R_work | 0.2000 WARNING: no Rfree given? |