| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1992-11-12 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data reduction _software.classification | XDS |
Data scaling _software.classification | XSCALE |
Refinement _software.classification | TNT |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | I 4 2 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 125.32 125.32 106.42 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1MDL |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-03-29 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 20.0 - 1.850 Å |
Rwork _refine.ls_R_factor_R_work | 0.1840 WARNING: no Rfree given (but Rwork)!? |