Experiment | |
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Method _exptl.method | X-RAY DIFFRACTION The method used in the experiment. |
Temperature [K] _diffrn.ambient_temp | 298 The mean temperature in kelvins at which the intensities were |
Detector technology _diffrn_detector.detector | AREA DETECTOR The general class of the radiation detector. |
Collection date _diffrn_detector.pdbx_collection_date | 1996-05-05 The date of data collection. |
Detector _diffrn_detector.type | SIEMENS-NICOLET X100 The make, model or name of the detector device used. |
Software | |
Data reduction _software.classification | XENGEN The classification of the program according to its |
Phasing _software.classification | X-PLOR The classification of the program according to its |
Model building _software.classification | X-PLOR The classification of the program according to its |
Refinement _software.classification | X-PLOR The classification of the program according to its |
General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 32 2 1 Hermann-Mauguin space-group symbol. Note that the |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 81.63 Unit-cell length a corresponding to the structure reported in 81.63 Unit-cell length b corresponding to the structure reported in 159.22 Unit-cell length c corresponding to the structure reported in 90.0 Unit-cell angle alpha of the reported structure in degrees. 90.0 Unit-cell angle beta of the reported structure in degrees. 120.0 Unit-cell angle gamma of the reported structure in degrees. |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 ÅThe radiation wavelength in angstroms. |
Refinement | |
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PDB entry ID _entry.id | 1KSZ |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1997-01-14 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 5.0 - 2.800 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1710 / 0.2500 |