| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1994-04-08 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data collection _software.classification | XENGEN |
Data reduction _software.classification | XENGEN |
Data scaling _software.classification | XENGEN |
Phasing _software.classification | X-PLOR (3.1) |
Model building _software.classification | X-PLOR (3.1) |
Refinement _software.classification | X-PLOR (3.1) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 1 2 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 129.22 60.45 56.77 90.00 119.02 90.00 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1KIR |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-10-23 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 7.0 - 2.000 Å |
R _refine.ls_R_factor_obs | 0.1670 |
Rwork _refine.ls_R_factor_R_work | 0.1670 WARNING: no Rfree given? |