| Experiment | |
|---|---|
Method _exptl.method | ELECTRON CRYSTALLOGRAPHY |
Source type _diffrn_source.source | ELECTRON MICROSCOPE |
Source details _diffrn_source.type | TECNAI F20 TEM |
Temperature [K] _diffrn.ambient_temp | 100 |
Detector technology _diffrn_detector.detector | CCD |
Collection date _diffrn_detector.pdbx_collection_date | 2016-02-03 |
Detector _diffrn_detector.type | TVIPS F416 CMOS CAMERA |
Wavelength(s) [Å] _diffrn_source.pdbx_wavelength_list | 0.0251 |
| Software | |
Data scaling _software.classification | SCALEPACK (Zbyszek Otwinowski; hkl@hkl-xray.com) |
Refinement _software.classification | REFMAC (Garib N. Murshudov; garib@ysbl.york.ac.uk) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 1 21 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 22.87 4.93 24.18 90.00 107.77 90.00 |
Wavelength _diffrn_radiation_wavelength.wavelength | 0.02510 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 5K2G |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 2016-05-18 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 23.0 - 1.100 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1866 / 0.2242 |