| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | ROTATING ANODE |
Source details _diffrn_source.type | SIEMENS |
Temperature [K] _diffrn.ambient_temp | 287 |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1994-08 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data reduction _software.classification | XENGEN |
Data scaling _software.classification | XENGEN |
Refinement #1 _software.classification | PROLSQ |
Refinement #2 _software.classification | XTALVIEW |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 49.32 124.05 76.38 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 10.000 |
High resolution limit [Å] _reflns.d_resolution_high | 2.700 |
Rmerge _reflns.pdbx_Rsym_value | 0.097 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 9011 |
<I/σ(I)> _reflns.pdbx_netI_over_sigmaI | 16.30 |
Completeness [%] _reflns.percent_possible_obs | 68.0 |
Multiplicity _reflns.pdbx_redundancy | 5.6 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1IDN |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1998-06-10 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 2.700 Å |
R _refine.ls_R_factor_obs | 0.1740 |
Rwork _refine.ls_R_factor_R_work | 0.1740 WARNING: no Rfree given? |
Structure solution method _refine.pdbx_method_to_determine_struct | MIR |