| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | IMAGE PLATE |
Collection date _diffrn_detector.pdbx_collection_date | 1994-02-14 |
Detector _diffrn_detector.type | RIGAKU |
| Software | |
Data collection #1 _software.classification | RAXIS (IIC DATA PROCESSING SOFTWARE T. HAGASHI) |
Data collection #2 _software.classification | RIGAKU (CORPORATION) |
Data collection #3 _software.classification | JAPAN |
Data reduction _software.classification | R-AXIS (IIC (HAGASHI/RIGAKU)) |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 54.03 44.43 92.74 92.71 103.17 69.15 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54000 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 47.970 |
High resolution limit [Å] _reflns.d_resolution_high | 2.370 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.100 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 26989 |
| <I/σ(I)> | - |
Completeness [%] _reflns.percent_possible_obs | 83.7 |
Multiplicity _reflns.pdbx_redundancy | 2.0 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1HTB |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-08-10 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 8.0 - 2.400 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1750 / 0.2430 |