| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | SRS BEAMLINE PX9.6 |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | SRS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | PX9.6 |
Detector technology _diffrn_detector.detector | FILM |
Collection date _diffrn_detector.pdbx_collection_date | 1988-03 |
Detector _diffrn_detector.type | FILM |
| Software | |
Data collection _software.classification | CCP4 |
Data reduction #1 _software.classification | DENZO |
Data reduction #2 _software.classification | CCP4 |
Phasing _software.classification | X-PLOR (3.1) |
Model building _software.classification | X-PLOR (3.1) |
Refinement _software.classification | X-PLOR (3.1) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 101.06 154.25 242.93 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 0.90100 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 20.000 |
High resolution limit [Å] _reflns.d_resolution_high | 3.000 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.138 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 57243 |
| <I/σ(I)> | - |
Completeness [%] _reflns.percent_possible_obs | 74.0 |
Multiplicity _reflns.pdbx_redundancy | 1.5 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1GNH |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-03-01 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 12.0 - 3.000 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2390 / 0.2730 |