Data quality metrics extracted from 1g4v.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 1G4V at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Experimental protocol
_diffrn_radiation.pdbx_diffrn_protocol
SINGLE WAVELENGTH
Source type
_diffrn_source.source
SYNCHROTRON
Source details
_diffrn_source.type
PHOTON FACTORY BEAMLINE BL-6A
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
Photon Factory
Beamline
_diffrn_source.pdbx_synchrotron_beamline
BL-6A
Temperature [K]
_diffrn.ambient_temp
293
Detector technology
_diffrn_detector.detector
IMAGE PLATE
Collection date
_diffrn_detector.pdbx_collection_date
1992-12-08
Detector
_diffrn_detector.type
FUJI
Software
Data reduction
_software.classification
PROCESS
Data scaling
_software.classification
SCALE
Phasing
_software.classification
X-PLOR
Model building
_software.classification
X-PLOR
Refinement
_software.classification
X-PLOR (3.1)
General information
Spacegroup name
_symmetry.space_group_name_H-M
C 2 2 21
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
155.3 87.1 79.4 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
1.00000 Å

Data quality metricsOverall
Low resolution limit [Å]
_reflns.d_resolution_low
20.000
High resolution limit [Å]
_reflns.d_resolution_high
2.000
Rmerge
_reflns.pdbx_Rmerge_I_obs
0.067
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique
_reflns.number_obs
27638
  <I/σ(I)> -
  Completeness [%] -
  Multiplicity -
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
1G4V
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
2000-10-28
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
10.0 - 2.000 Å
R
_refine.ls_R_factor_obs
0.2090
WARNING: neither Rwork nor Rfree given