| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1994-10-01 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data reduction _software.classification | XENGEN |
Data scaling _software.classification | XENGEN |
Phasing _software.classification | XTAL |
Model building _software.classification | XTAL |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 43 2 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 31.3 31.3 137.7 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | NA |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 5.000 |
High resolution limit [Å] _reflns.d_resolution_high | 2.300 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.081 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 3315 |
| <I/σ(I)> | - |
Completeness [%] _reflns.percent_possible_obs | 94.4 |
| Multiplicity | - |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1FIX |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-10-24 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 5.0 - 2.300 Å |
R _refine.ls_R_factor_obs | 0.1450 |
Rwork _refine.ls_R_factor_R_work | 0.1450 WARNING: no Rfree given? |
Structure solution method _refine.pdbx_method_to_determine_struct | MIR |
Starting model _refine.pdbx_starting_model | A-FORM DUPLEX |