| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | DIFFRACTOMETER |
Collection date _diffrn_detector.pdbx_collection_date | 1995-09-22 |
Detector _diffrn_detector.type | ENRAF-NONIUS FAST |
| Software | |
Data collection #1 _software.classification | MADNES |
Data collection #2 _software.classification | PROCOR |
Data collection #3 _software.classification | FBSCALE |
Data reduction #1 _software.classification | MADNES |
Data reduction #2 _software.classification | PROCOR |
Data reduction #3 _software.classification | FBSCALE |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 1 2 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 67.83 26.35 51.79 90.00 94.94 90.00 |
Wavelength _diffrn_radiation_wavelength.wavelength | NA |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1ERU |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-02-07 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 15.0 - 2.100 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2200 / 0.3300 |