Data quality metrics extracted from 1eiy.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.

Experimental information for 1EIY at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Experimental protocol
_diffrn_radiation.pdbx_diffrn_protocol
SINGLE WAVELENGTH
Source type
_diffrn_source.source
SYNCHROTRON
Source details
_diffrn_source.type
LURE BEAMLINE D41A
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
LURE
Beamline
_diffrn_source.pdbx_synchrotron_beamline
D41A
Temperature [K]
_diffrn.ambient_temp
293
Detector technology
_diffrn_detector.detector
IMAGE PLATE
Collection date
_diffrn_detector.pdbx_collection_date
1993-10-10
Detector
_diffrn_detector.type
MARRESEARCH
Software
Data reduction
_software.classification
DENZO
Data scaling
_software.classification
X-GEN
Phasing
_software.classification
X-PLOR
Model building
_software.classification
X-PLOR
Refinement
_software.classification
X-PLOR (3.1)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 32 2 1
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
175.0 175.0 140.6 90.0 90.0 120.0
Wavelength
_diffrn_radiation_wavelength.wavelength
1.541800.99000 Å

Data quality metricsOverall
Low resolution limit [Å] 
_reflns.d_resolution_low
 28.000
High resolution limit [Å] 
_reflns.d_resolution_high
 3.300
Rmerge 
_reflns.pdbx_Rmerge_I_obs
 0.158
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique 
_reflns.number_obs
 33340
  <I/σ(I)> -
Completeness [%] 
_reflns.percent_possible_obs
 86.3
  Multiplicity -
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
1EIY
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
2000-02-29
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
28.0 - 3.300 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.2210 / 0.2870