| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Detector technology _diffrn_detector.detector | IMAGE PLATE |
Collection date _diffrn_detector.pdbx_collection_date | 1993-06-21 |
Detector _diffrn_detector.type | RIGAKU |
| Software | |
Data reduction _software.classification | R-AXIS (IIC) |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 43 21 2 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 169.59 169.59 151.10 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1EGE |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-04-11 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 2.750 Å |
R _refine.ls_R_factor_obs | 0.2210 |
Rwork _refine.ls_R_factor_R_work | 0.2210 WARNING: no Rfree given? |