Data quality metrics extracted from 3ef9.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 3EF9 at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Experimental protocol
_diffrn_radiation.pdbx_diffrn_protocol
SINGLE WAVELENGTH
Source type
_diffrn_source.source
SYNCHROTRON
Source details
_diffrn_source.type
APS BEAMLINE 22-ID
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
APS
Beamline
_diffrn_source.pdbx_synchrotron_beamline
22-ID
Detector technology
_diffrn_detector.detector
CCD
Collection date
_diffrn_detector.pdbx_collection_date
2008-06-28
Detector
_diffrn_detector.type
MARMOSAIC 300 mm CCD
Software
Data reduction #1
_software.classification
DENZO (Zbyszek Otwinowski; hkl@hkl-xray.com)
Data reduction #2
_software.classification
HKL-2000
Data scaling
_software.classification
SCALEPACK (Zbyszek Otwinowski; hkl@hkl-xray.com)
Phasing
_software.classification
CNS
Refinement
_software.classification
CNS (Axel T. Brunger; axel.brunger@yale.edu)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 31 2 1
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
96.349 96.349 83.561 90.0 90.0 120.0
Wavelength
_diffrn_radiation_wavelength.wavelength
NA

Data quality metricsOverallOuterShell
Low resolution limit [Å]
_reflns.d_resolution_low _reflns_shell.d_res_low
50.000 3.110
High resolution limit [Å]
_reflns.d_resolution_high _reflns_shell.d_res_high
3.000 3.000
Rmerge
_reflns.pdbx_Rmerge_I_obs
0.195 -
  Rmeas - -
  Rpim - -
  Total number of observations - -
Total number unique
_reflns.number_obs _reflns_shell.number_unique_all
6685 194
<I/σ(I)>
_reflns.pdbx_netI_over_sigmaI
5.36 -
Completeness [%]
_reflns.percent_possible_obs _reflns_shell.percent_possible_all
75.5 22.6
Multiplicity
_reflns.pdbx_redundancy _reflns_shell.pdbx_redundancy
2.5 1.1
  CC(1/2) - -

Refinement
PDB entry ID
_entry.id
3EF9
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
2008-09-08
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
50.0 - 3.200 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.2520 / 0.2980