Experiment | |
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Method _exptl.method | X-RAY DIFFRACTION The method used in the experiment. |
Experimental protocol _diffrn_radiation.pdbx_diffrn_protocol | SINGLE WAVELENGTH SINGLE WAVELENGTH, LAUE, or MAD. |
Source type _diffrn_source.source | ROTATING ANODE The general class of the radiation source. |
Source details _diffrn_source.type | RIGAKU RU200 The make, model or name of the source of radiation. |
Temperature [K] _diffrn.ambient_temp | 298 The mean temperature in kelvins at which the intensities were |
Detector technology _diffrn_detector.detector | IMAGE PLATE The general class of the radiation detector. |
Detector _diffrn_detector.type | RIGAKU RAXIS IIC The make, model or name of the detector device used. |
Software | |
Refinement _software.classification | X-PLOR The classification of the program according to its |
General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 1 21 1 Hermann-Mauguin space-group symbol. Note that the |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 59.41 Unit-cell length a corresponding to the structure reported in 61.95 Unit-cell length b corresponding to the structure reported in 51.84 Unit-cell length c corresponding to the structure reported in 90.0 Unit-cell angle alpha of the reported structure in degrees. 90.0 Unit-cell angle beta of the reported structure in degrees. 90.0 Unit-cell angle gamma of the reported structure in degrees. |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54000 ÅThe radiation wavelength in angstroms. |
Refinement | |
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PDB entry ID _entry.id | 1EBK |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 2000-01-24 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 8.0 - 2.060 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1920 / 0.3060 |