| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Collection date _diffrn_detector.pdbx_collection_date | 1992-06-24 |
Detector _diffrn_detector.type | SIEMENS |
Wavelength(s) [Å] _diffrn_source.pdbx_wavelength_list | 1.5418 |
| Software | |
Data reduction _software.classification | XENGEN |
Refinement _software.classification | PROFFT |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 1 21 1 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 69.9 43.6 37.6 90.0 117.7 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1DYR |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1994-09-14 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 1.860 Å |
R _refine.ls_R_factor_obs | 0.1810 WARNING: neither Rwork nor Rfree given |