| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | SRS BEAMLINE PX7.2 |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | SRS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | PX7.2 |
Detector technology _diffrn_detector.detector | FILM |
Collection date _diffrn_detector.pdbx_collection_date | 1986 |
| Software | |
Data collection _software.classification | CCP4 |
Data reduction _software.classification | CCP4 |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement #1 _software.classification | PROLSQ |
Refinement #2 _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 49.6 85.6 178.7 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.48800 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1DOT |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-08-03 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 2.350 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2300 / 0.3200 |