Experiment | |
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Method _exptl.method | X-RAY DIFFRACTION The method used in the experiment. |
Source type _diffrn_source.source | SYNCHROTRON The general class of the radiation source. |
Source details _diffrn_source.type | SRS BEAMLINE PX7.2 The make, model or name of the source of radiation. |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | SRS Synchrotron site. |
Beamline _diffrn_source.pdbx_synchrotron_beamline | PX7.2 Synchrotron beamline. |
Detector technology _diffrn_detector.detector | FILM The general class of the radiation detector. |
Collection date _diffrn_detector.pdbx_collection_date | 1986 The date of data collection. |
Software | |
Data collection _software.classification | CCP4 The classification of the program according to its |
Data reduction _software.classification | CCP4 The classification of the program according to its |
Phasing _software.classification | X-PLOR The classification of the program according to its |
Model building _software.classification | X-PLOR The classification of the program according to its |
Refinement #1 _software.classification | PROLSQ The classification of the program according to its |
Refinement #2 _software.classification | X-PLOR The classification of the program according to its |
General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 Hermann-Mauguin space-group symbol. Note that the |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 49.6 Unit-cell length a corresponding to the structure reported in 85.6 Unit-cell length b corresponding to the structure reported in 178.7 Unit-cell length c corresponding to the structure reported in 90.0 Unit-cell angle alpha of the reported structure in degrees. 90.0 Unit-cell angle beta of the reported structure in degrees. 90.0 Unit-cell angle gamma of the reported structure in degrees. |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.48800 ÅThe radiation wavelength in angstroms. |
Refinement | |
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PDB entry ID _entry.id | 1DOT |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-08-03 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 2.350 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2300 / 0.3200 |