Data quality metrics extracted from 1d1k.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 1D1K at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Experimental protocol
_diffrn_radiation.pdbx_diffrn_protocol
SINGLE WAVELENGTH
Source type
_diffrn_source.source
ROTATING ANODE
Source details
_diffrn_source.type
SIEMENS
Temperature [K]
_diffrn.ambient_temp
298.0
Detector technology
_diffrn_detector.detector
AREA DETECTOR
Collection date
_diffrn_detector.pdbx_collection_date
1998-02-12
Detector
_diffrn_detector.type
SIEMENS
Software
Data reduction
_software.classification
X-GEN
Data scaling
_software.classification
X-GEN
Phasing
_software.classification
AMoRE
Refinement
_software.classification
CNS
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 1
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
44.223 44.131 53.710 106.05 106.38 99.26
Wavelength
_diffrn_radiation_wavelength.wavelength
1.54180 Å

Data quality metricsOverallOuterShell
Low resolution limit [Å]
_reflns.d_resolution_low _reflns_shell.d_res_low
25.800 2.030
High resolution limit [Å]
_reflns.d_resolution_high _reflns_shell.d_res_high
2.000 2.000
Rmerge
_reflns.pdbx_Rmerge_I_obs _reflns_shell.Rmerge_I_obs
0.062 0.330
  Rmeas - -
  Rpim - -
  Total number of observations - -
Total number unique
_reflns.number_obs _reflns_shell.number_unique_all
22215 400
<I/σ(I)>
_reflns.pdbx_netI_over_sigmaI
12.17 -
Completeness [%]
_reflns.percent_possible_obs _reflns_shell.percent_possible_all
91.0 41.1
Multiplicity
_reflns.pdbx_redundancy _reflns_shell.pdbx_redundancy
1.7 1.6
  CC(1/2) - -

Refinement
PDB entry ID
_entry.id
1D1K
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1999-09-17
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
25.8 - 2.000 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.1930 / 0.2180