Data quality metrics extracted from 1crk.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 1CRK at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Source type
_diffrn_source.source
ROTATING ANODE
Source details
_diffrn_source.type
ELLIOTT GX-18
Temperature [K]
_diffrn.ambient_temp
277
Detector technology
_diffrn_detector.detector
AREA DETECTOR
Collection date
_diffrn_detector.pdbx_collection_date
1993-08-27
Detector
_diffrn_detector.type
SIEMENS
Software
Data reduction
_software.classification
XDS
Data scaling
_software.classification
XSCALE
Phasing
_software.classification
X-PLOR
Model building #1
_software.classification
MIR
Model building #2
_software.classification
X-PLOR
Refinement
_software.classification
X-PLOR
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 42
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
126.0 126.0 144.7 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
1.54180 Å

Data quality metricsOverall
Low resolution limit [Å]
_reflns.d_resolution_low
100.000
High resolution limit [Å]
_reflns.d_resolution_high
3.000
Rmerge
_reflns.pdbx_Rmerge_I_obs
0.114
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique
_reflns.number_obs
45021
<I/σ(I)>
_reflns.pdbx_netI_over_sigmaI
14.84
Completeness [%]
_reflns.percent_possible_obs
99.5
Multiplicity
_reflns.pdbx_redundancy
6.0
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
1CRK
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1996-03-08
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
8.0 - 3.000 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.2170 / 0.2640
Structure solution method
_refine.pdbx_method_to_determine_struct
SIR AND PHASEEXTENS