| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Collection date _diffrn_detector.pdbx_collection_date | 1994-03-07 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data collection _software.classification | XENGEN |
Data reduction _software.classification | XENGEN |
Phasing _software.classification | X-PLOR |
Model building _software.classification | X-PLOR |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 2 2 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 58.62 152.17 102.10 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 2CPO |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1996-02-10 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 8.0 - 2.100 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1860 / 0.2280 |