Data quality metrics extracted from 4cgt.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.


Experimental information for 4CGT at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Source type
_diffrn_source.source
ROTATING ANODE
Source details
_diffrn_source.type
RIGAKU RUH2R
Temperature [K]
_diffrn.ambient_temp
298
Detector technology
_diffrn_detector.detector
AREA DETECTOR
Collection date
_diffrn_detector.pdbx_collection_date
1994-09
Detector
_diffrn_detector.type
SIEMENS
Software
Data reduction
_software.classification
XDS
Data scaling #1
_software.classification
XDS
Data scaling #2
_software.classification
XSCALE
Phasing
_software.classification
X-PLOR (3.1)
Model building
_software.classification
X-PLOR (3.1)
Refinement
_software.classification
X-PLOR (3.1)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 21 21 21
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
94.5 104.6 113.4 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
1.54180 Å

Data quality metricsOverall
Low resolution limit [Å]
_reflns.d_resolution_low
26.630
High resolution limit [Å]
_reflns.d_resolution_high
2.600
Rmerge
_reflns.pdbx_Rsym_value
0.111
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique
_reflns.number_obs
30720
  <I/σ(I)> -
Completeness [%]
_reflns.percent_possible_obs
88.0
  Multiplicity -
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
4CGT
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1998-06-06
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
10.0 - 2.600 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.1940 / 0.2720
Structure solution method
_refine.pdbx_method_to_determine_struct
X-PLOR
Starting model
_refine.pdbx_starting_model
WILD-TYPE WITH RESIDUES 145 - 151 DELETED