| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Experimental protocol _diffrn_radiation.pdbx_diffrn_protocol | SINGLE WAVELENGTH |
Source type _diffrn_source.source | SYNCHROTRON |
Source details _diffrn_source.type | NSLS BEAMLINE X25 |
Synchrotron site _diffrn_source.pdbx_synchrotron_site | NSLS |
Beamline _diffrn_source.pdbx_synchrotron_beamline | X25 |
Temperature [K] _diffrn.ambient_temp | 100 |
Detector technology _diffrn_detector.detector | CCD |
Collection date _diffrn_detector.pdbx_collection_date | 1998-06-15 |
Detector _diffrn_detector.type | BRANDEIS - B4 |
| Software | |
Data reduction _software.classification | DENZO |
Data scaling _software.classification | SCALEPACK |
Phasing _software.classification | CNS |
Model building _software.classification | O |
Refinement _software.classification | CNS |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | C 2 2 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 212.0 301.4 576.3 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.220001.10000 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 130.000 |
High resolution limit [Å] _reflns.d_resolution_high | 3.750 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.103 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
| Total number unique | - |
<I/σ(I)> _reflns.pdbx_netI_over_sigmaI | 13.00 |
Completeness [%] _reflns.percent_possible_obs | 98.6 |
Multiplicity _reflns.pdbx_redundancy | 5.2 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1C04 |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1999-07-14 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 60.0 - 5.000 Å |