| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Temperature [K] _diffrn.ambient_temp | 125 |
Detector technology _diffrn_detector.detector | DIFFRACTOMETER |
Collection date _diffrn_detector.pdbx_collection_date | 1984-06 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data collection _software.classification | SIEMENS (XDISK) |
Data reduction #1 _software.classification | XFIT |
Data reduction #2 _software.classification | SIEMENS (XDISK) |
Phasing _software.classification | SHELXL-93 |
Model building _software.classification | SHELXL-93 |
Refinement _software.classification | SHELXL-93 |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 75.390 22.581 28.600 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1BPI |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1995-02-18 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 10.0 - 1.090 Å |
R _refine.ls_R_factor_obs | 0.1870 WARNING: neither Rwork nor Rfree given |