| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | ROTATING ANODE |
Source details _diffrn_source.type | SIEMENS |
Temperature [K] _diffrn.ambient_temp | 295 |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1997-01 |
Detector _diffrn_detector.type | SIEMENS |
| Software | |
Data reduction _software.classification | XDS |
Data scaling _software.classification | XDS |
Phasing _software.classification | MLPHARE |
Refinement _software.classification | X-PLOR (3.857) |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 85.0 90.3 143.1 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | 1.54180 Å |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 29.000 |
High resolution limit [Å] _reflns.d_resolution_high | 3.100 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.077 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 19430 |
<I/σ(I)> _reflns.pdbx_netI_over_sigmaI | 9.40 |
Completeness [%] _reflns.percent_possible_obs | 92.0 |
Multiplicity _reflns.pdbx_redundancy | 2.3 |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 1BIH |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1998-06-17 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 20.0 - 3.100 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.2180 / 0.2640 |
Structure solution method _refine.pdbx_method_to_determine_struct | MIR |