Data quality metrics extracted from 1a79.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.

Experimental information for 1A79 at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Source type
_diffrn_source.source
SYNCHROTRON
Source details
_diffrn_source.type
NSLS BEAMLINE X4A
Synchrotron site
_diffrn_source.pdbx_synchrotron_site
NSLS
Beamline
_diffrn_source.pdbx_synchrotron_beamline
X4A
Temperature [K]
_diffrn.ambient_temp
100
Detector technology
_diffrn_detector.detector
IMAGE PLATE
Collection date
_diffrn_detector.pdbx_collection_date
1997-09-07
Detector
_diffrn_detector.type
FUJI
Wavelength(s) [Å]
_diffrn_source.pdbx_wavelength_list
1.02, 1.54
Software
Data reduction
_software.classification
HKL
Data scaling
_software.classification
HKL
Phasing
_software.classification
CCP4
Model building
_software.classification
CCP4
Refinement
_software.classification
X-PLOR (3.857)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 21 21 21
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
61.95 80.04 193.59 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
1.020001.54000 Å

Data quality metricsOverall
Low resolution limit [Å] 
_reflns.d_resolution_low
 100.000
High resolution limit [Å] 
_reflns.d_resolution_high
 2.300
Rmerge 
_reflns.pdbx_Rmerge_I_obs
 0.054
  Rmeas -
  Rpim -
  Total number of observations -
Total number unique 
_reflns.number_obs
 75778
<I/σ(I)> 
_reflns.pdbx_netI_over_sigmaI
 10.30
Completeness [%] 
_reflns.percent_possible_obs
 90.4
Multiplicity 
_reflns.pdbx_redundancy
 2.2
  CC(1/2) -

Refinement
PDB entry ID
_entry.id
1A79
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1998-03-23
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
50.0 - 2.280 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.2000 / 0.2670
Structure solution method
_refine.pdbx_method_to_determine_struct
MAD