| Experiment | |
|---|---|
Method _exptl.method | X-RAY DIFFRACTION |
Source type _diffrn_source.source | ROTATING ANODE |
Temperature [K] _diffrn.ambient_temp | 295.00 |
Detector technology _diffrn_detector.detector | AREA DETECTOR |
Collection date _diffrn_detector.pdbx_collection_date | 1995-04-01 |
Detector _diffrn_detector.type | SIEMENS-NICOLET |
| Software | |
Data reduction _software.classification | XENGEN (V. 2.0) |
Refinement _software.classification | X-PLOR |
| General information | |
Spacegroup name _symmetry.space_group_name_H-M | P 21 21 21 |
Unit cell parameters _cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma} | 24.78 44.57 48.00 90.0 90.0 90.0 |
Wavelength _diffrn_radiation_wavelength.wavelength | NA |
| Data quality metrics | Overall |
|---|---|
Low resolution limit [Å] _reflns.d_resolution_low | 8.000 |
High resolution limit [Å] _reflns.d_resolution_high | 2.150 |
Rmerge _reflns.pdbx_Rmerge_I_obs | 0.029 |
| Rmeas | - |
| Rpim | - |
| Total number of observations | - |
Total number unique _reflns.number_obs | 2643 |
<I/σ(I)> _reflns.pdbx_netI_over_sigmaI | 26.00 |
Completeness [%] _reflns.percent_possible_obs | 86.0 |
| Multiplicity | - |
| CC(1/2) | - |
| Refinement | |
|---|---|
PDB entry ID _entry.id | 323D |
Deposition date _pdbx_database_status.recvd_initial_deposition_date | 1997-03-17 |
Resolution _refine.ls_d_res_low _refine.ls_d_res_high | 8.0 - 2.150 Å |
Rwork/Rfree _refine.ls_R_factor_R_work _refine.ls_R_factor_R_free | 0.1550 / 0.1860 |