Data quality metrics extracted from 400d.cif.gz by aB_cif2table1 from BUSTER (Global Phasing Ltd.). See also the PDBx/mmCIF dictionary and a MXLIMS-compatible JSON representation.

Experimental information for 400D at RCSB, PDBe, PDBj

Experiment
Method
_exptl.method
X-RAY DIFFRACTION
Source type
_diffrn_source.source
ROTATING ANODE
Source details
_diffrn_source.type
SIEMENS
Temperature [K]
_diffrn.ambient_temp
298.00
Detector technology
_diffrn_detector.detector
DIFFRACTOMETER
Collection date
_diffrn_detector.pdbx_collection_date
1992-06-01
Detector
_diffrn_detector.type
SIEMENS
Software
Data reduction
_software.classification
XSCANS
Data scaling
_software.classification
XSCANS
Refinement
_software.classification
X-PLOR (3.1)
General information
Spacegroup name
_symmetry.space_group_name_H-M
P 21 21 21
Unit cell parameters
_cell.length_{a,b,c} _cell.angle_{alpha,beta,gamma}
17.79 30.90 44.36 90.0 90.0 90.0
Wavelength
_diffrn_radiation_wavelength.wavelength
NA

Refinement
PDB entry ID
_entry.id
400D
Deposition date
_pdbx_database_status.recvd_initial_deposition_date
1998-05-28
Resolution
_refine.ls_d_res_low _refine.ls_d_res_high
8.0 - 1.650 Å
Rwork/Rfree
_refine.ls_R_factor_R_work _refine.ls_R_factor_R_free
0.1960 / 0.2480